By Jose Moreira
Offering a whole creation to the cutting-edge in high-speed electronic checking out with computerized try out gear (ATE), this useful source is the 1st booklet to concentration completely in this more and more very important subject. that includes transparent examples, this one-stop reference covers all severe features of the topic, from high-speed electronic fundamentals, ATE instrumentation for electronic functions, and attempt and measurements, to creation trying out, help instrumentation and textual content fixture layout.
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Extra resources for An Engineer's Guide to Automated Testing of High-Speed Interfaces
22 An Engineer’s Guide to Automated Testing of High-Speed Interfaces dependency. In the figure, the noise of the receiver moves some of the strobing edges to wrong positions that might generate bit errors. The measurement setup uses a 10-bit pattern to compute the BER of the system. 2. 18 Simplistic example showing how the measured BER can be different from the “real BER” due to the used pattern. For measuring a DUT BER, one needs to be able to transmit bits to the DUT, find out if the transmitted bit was correctly received by the DUT, receive bits from the DUT, and find out if the received bits correspond to the intended bits to be transmitted by the DUT.
Random Jitter Random jitter (RJ) is defined as being unbounded in the sense that there is always a probability (although it can be very small) of the jitter value reaching any value. Random jitter is usually modeled using a Gaussian (also known as normal) probability distribution. One important reason for using a Gaussian distribution to model random jitter is due to the central limit theorem (see Appendix A). The theorem states that the sum of an infinite number of arbitrary probability distributions is a Gaussian distribution.
The idea is to measure the time interval error of each edge of the signal and generate a histogram of the measurements. The exact way the measurement array of values required for the histogram is generated depends on the specifics of the measurement methodology and instrument (to be discussed with more detail in Chapter 5). Typically an array of values for the measured jitter at each transition is generated. From this array a histogram can be computed. 23 shows an example of an array of jitter values.